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주요특징
Key Features
Can be installed on
your X-ray equipment
Able to perform
inline/offline
automated inspection
Able to inspect
various defect types
of electronic parts simultaneously
Provides a review mode that allows you to view and modify inspection results
Can be used in
conjunction with
CT slice images
검사항목
Inspection Items

BGA / Wafer

Land Grid Array

QFN / QFP / Pad

Wire / Chip

LED
제품군
Family Products
시스템요구사양
System Requirements
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